LH28F016SU データシートの表示（PDF） - Sharp Electronics
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LH28F016SU Datasheet PDF : 37 Pages
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16M (1M × 16, 2M × 8) Flash Memory
LH28F016SU
2.4
2.0
INPUT
TEST POINTS
0.45
0.8
2.0
OUTPUT
0.8
NOTE:
AC test inputs are driven at VOH (2.4 VTTL) for a Logic '1' and VOL
(0.45 VTTL) for a Logic '0'. Input timing begins at VIH (2.0 VTTL)
and VIL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise
and fall times (10% to 90%) < 10 ns.
28F016SUT-6
Figure 7. Transient Input/Output
Reference Waveform (VCC = 5.0 V)
2.5 ns OF 50 Ω TRANSMISSION LINE
FROM OUTPUT
UNDER TEST
TEST
POINT
TOTAL CAPACITANCE = 50 pF
28F016SUT-8
Figure 9. Transient Equivalent Testing
Load Circuit (VCC = 3.3 V)
3.0
INPUT 1.5
0.0
TEST POINTS
1.5 OUTPUT
NOTE:
AC test inputs are driven at 3.0 V for a Logic '1' and 0.0 V for a
Logic '0'. Input timing begins and output timing ends at 1.5 V.
Input rise and fall times (10% to 90%) < 10 ns.
28F016SUT-7
Figure 8. Equivalent Testing
Load Circuit (VCC = 3.3 V)
2.5 ns OF 25 Ω TRANSMISSION LINE
FROM OUTPUT
UNDER TEST
TEST
POINT
TOTAL CAPACITANCE = 100 pF
28F016SUT-9
Figure 10. Transient Equivalent Testing
Load Circuit (VCC = 5.0 V)
2.5 ns OF 83Ω TRANSMISSION LINE
FROM OUTPUT
UNDER TEST
TEST
POINT
TOTAL CAPACITANCE = 30 pF
28F016SUT-18
Figure 11. High Speed Transient Equivalent
Testing Load Circuit (VCC = 5.0 V ± 5%)
17
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