AUIRFN8459
Fig 22. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs
Fig 22a. Unclamped Inductive Test Circuit
Fig 22b. Unclamped Inductive Waveforms
Fig 23a. Switching Time Test Circuit
Fig 23b. Switching Time Waveforms
VDD
Fig 24a. Gate Charge Test Circuit
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Fig 24b. Gate Charge Waveform
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July 29, 2014