SI4362 データシートの表示（PDF） - Silicon Laboratories

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SI4362

HIGH-PERFORMANCE, LOW-CURRENT RECEIVER

Silicon Laboratories 

Si4362

Table 7. Thermal Characteristics

Parameter

Thermal Resistance Junction to Ambient

Junction Temperature

Symbol

JA

TJ

Test Condition

Still Air

Value

30

125

Unit

C/W

C

Table 8. Absolute Maximum Ratings

Parameter

VDD to GND

Voltage on Digital Control Inputs

Voltage on Analog Inputs

RX Input Power

Operating Ambient Temperature Range TA

Thermal Impedance JA

Junction Temperature TJ

Storage Temperature Range TSTG

Value

–0.3, +3.6

–0.3, VDD + 0.3

–0.3, VDD + 0.3

+10

–40 to +85

30

+125

–55 to +125

Unit

V

V

V

dBm

C

C/W

C

C

Note: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These

are stress ratings only and functional operation of the device at or beyond these ratings in the operational sections of

the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect

device reliability. Caution: ESD sensitive device.

10

Rev 0.4

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