CBT3257ADS,118 データシートの表示（PDF） - NXP Semiconductors.

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CBT3257ADS,118

Quad 1-of-2 multiplexer/demultiplexer

NXP Semiconductors. 

NXP Semiconductors

12. Test information

CBT3257A

Quad 1-of-2 multiplexer/demultiplexer

tW

VI 90 %

negative

pulse

VM

10 %

0V

tf

VI

positive

pulse

tr

90 %

VM

10 %

0V

tW

VI

G

VCC

VO

DUT

RT

VM

tr

tf

VM

VEXT

RL

CL

RL

001aae331

Fig 7.

Test data is given in Table 9.

Definitions for test circuit:

RL = Load resistance.

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to the output impedance Zo of the pulse generator.

VEXT = External voltage for measuring switching times.

Test circuit for measuring switching times

Table 9. Test data

Supply voltage Input

VCC

4.5 V to 5.5 V

VI

GND to 3.0 V

tr, tf

≤ 2.5 ns

Load

CL

50 pF

RL

500 Ω

VEXT

tPLH, tPHL

open

tPLZ, tPZL

7.0 V

tPHZ, tPZH

open

CBT3257A_4

Product data sheet

Rev. 04 — 19 March 2009

© NXP B.V. 2009. All rights reserved.

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