LM317M データシートの表示（PDF） - ON Semiconductor
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LM317M Datasheet PDF : 14 Pages
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LM317M, NCV317MAB, NCV317MB
ELECTRICAL CHARACTERISTICS (VI − VO = 5.0 V; IO = 0.1 A, TJ = Tlow to Thigh (Note 7), unless otherwise noted.)
Characteristics
Line Regulation (Note 8) (TA = 25°C, 3.0 V ≤ VI − VO ≤ 40 V)
Load Regulation (Note 8)
TA = 25°C, 10 mA ≤ IO ≤ 0.5 A
VO ≤ 5.0 V
VO ≥ 5.0 V
Adjustment Pin Current
Adjustment Pin Current Change
2.5 V ≤ VI − VO ≤ 40 V, 10 mA ≤ IL ≤ 0.5 A, PD ≤ Pmax
Reference Voltage
3.0 V ≤ VI − VO ≤ 40 V, 10 mA ≤ IL ≤ 0.5 A, PD ≤ Pmax
Line Regulation (Note 8)
3.0 V ≤ VI−VO ≤ 40 V
Load Regulation (Note 8)
10 mA ≤ IO ≤ 0.5 A
VO ≤ 5.0 V
VO ≥ 5.0 V
Temperature Stability (Tlow ≤ TJ ≤ Thigh)
Minimum Load Current to Maintain Regulation (VI − VO = 40 V)
Maximum Output Current
VI − VO ≤ 15 V, PD ≤ Pmax
VI − VO = 40 V, PD ≤ Pmax, TA = 25°C
RMS Noise, % of VO (TA = 25°C, 10 Hz ≤ f ≤ 10 kHz)
Ripple Rejection, VO = 10 V, f = 120 Hz (Note 9)
Without CAdj
CAdj = 10 mF
Thermal Shutdown (Note 10)
Figure
3
4
5
3, 4
Symbol
Regline
Regload
IAdj
DIAdj
LM317MA / LM317MAB/NCV317MAB
Min
Typ
Max
−
0.01
0.04
−
5.0
25
−
0.1
0.5
−
50
100
−
0.2
5.0
Unit
%/V
mV
% VO
mA
mA
5
Vref
1.225
1.250
1.275
V
3
Regline
−
0.02
0.07
%/V
4
Regload
−
−
5
TS
−
5
ILmin
−
5
Imax
0.5
0.15
−
N
−
6
RR
−
66
−
−
−
20
0.3
0.7
3.5
0.9
0.25
−
65
80
180
70
mV
1.5
% VO
−
% VO
10
mA
A
−
−
−
% VO
dB
−
−
−
°C
Long−Term Stability, TJ = Thigh (Note 11)
TA= 25°C for End−point Measurements
5
S
−
0.3
1.0
%/1.0
kHrs.
7. Tlow to Thigh = 0° to +125°C for LM317MA Tlow to Thigh = − 40° to +125°C for LM317MAB, NCV317MAB.
8. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account
separately. Pulse testing with low duty cycle is used.
9. CAdj, when used, is connected between the adjustment pin and ground.
10. Thermal characteristics are not subject to production test.
11. Since Long−Term Stability cannot be measured on each device before shipment, this specification is an engineering estimate of average
stability from lot−to−lot.
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