FSFR1800L データシートの表示（PDF） - Fairchild Semiconductor

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FSFR1800L

Fairchild Power Switch (FPS™) for Half-Bridge Resonant Converters

Fairchild Semiconductor 

Electrical Characteristics (Continued)

TA=25°C unless otherwise specified.

Symbol

Parameter

Test Conditions

Min. Typ. Max. Unit

UVLO Section

LVCCUV+ LVCC Supply Under-Voltage Positive Going Threshold (LVCC Start)

LVCCUV- LVCC Supply Under-Voltage Negative Going Threshold (LVCC Stop)

LVCCUVH LVCC Supply Under-Voltage Hysteresis

HVCCUV+ HVCC Supply Under-Voltage Positive Going Threshold (HVCC Start)

HVCCUV- HVCC Supply Under-Voltage Negative Going Threshold (HVCC Stop)

HVCCUVH HVCC Supply Under-Voltage Hysteresis

Oscillator & Feedback Section

13.0 14.5 16.0 V

10.2 11.3 12.4 V

3.2

V

8.2 9.2 10.2 V

7.8 8.7 9.6

V

0.5

V

VCONDIS

VCONEN

VRT

fOSC

DC

Control Pin Disable Threshold Voltage

Control Pin Enable Threshold Voltage

V-I Converter Threshold Voltage

Output Oscillation Frequency

Output Duty Cycle

RT=5.2KΩ

0.36 0.40 0.44 V

0.54 0.60 0.66 V

1.5 2.0 2.5

V

94 100 106 KHz

48

50

52

%

fSS

Internal Soft-Start Initial Frequency

tSS

Internal Soft-Start Time

Protection Section

fSS=fOSC+40kHz, RT=5.2KΩ

140

KHz

2

3

4

ms

IOLP

VOLP

VOVP

OLP Delay Current

OLP Protection Voltage

LVCC Over-Voltage Protection

VCON=4V

VCON > 3.5V

L-VCC > 21V

3.6 4.8 6.0 μA

4.5 5.0 5.5

V

21

23

25

V

VAOCP

tBAO

AOCP Threshold Voltage

AOCP Blanking Time(6)

ΔV/Δt=-0.1V/µs

-1.0 -0.9 -0.8

V

VCS < VAOCP; ΔV/Δt=-0.1V/µs

50

ns

VOCP

tBO

OCP Threshold Voltage

OCP Blanking Time(6)

V/Δt=-1V/µs

VCS < VOCP; ΔV/Δt=-1V/µs

-0.64 -0.58 -0.52 V

1.0 1.5 2.0 μs

tDA

Delay Time (Low Side) Detecting from

VAOCP to Switch Off(6)

ΔV/Δt=-1V/µs

TSD

Thermal Shutdown Temperature(6)

250 400 ns

110 130 150 °C

ISU

Protection Latch Sustain LVCC Supply

Current

LVCC=7.5V

100 150 μA

VPRSET

Protection Latch Reset LVCC Supply

Voltage

5

V

Dead-Time Control Section

DT

Dead Time(7)

350

ns

Notes:

6. This parameter, although guaranteed, is not tested in production.

7. These parameters, although guaranteed, are tested only in EDS (wafer test) process.

© 2007 Fairchild Semiconductor Corporation

FSFR series Rev.1.0.9

7

www.fairchildsemi.com

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