LTC6803-2 データシートの表示（PDF） - Linear Technology
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LTC6803-2 Datasheet PDF : 40 Pages
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LTC6803-2/LTC6803-4
ELECTRICAL CHARACTERISTICS The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. V+ = 43.2V, V– = 0V, unless otherwise noted.
SYMBOL PARAMETER
Voltage Mode Digital I/O
VIH
Digital Input Voltage High
VIL
Digital Input Voltage Low
VOL
Digital Output Voltage Low
IIN
Digital Input Current
CONDITIONS
Pins SCKI, SDI and CSBI
Pins SCKI, SDI and CSBI
Pin SDO, Sinking 500µA
VMODE, TOS, SCKI, SDI, CSBI
MIN
TYP
MAX
l
2
l
0.8
l
0.3
l
10
UNITS
V
V
V
µA
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: The ADC specifications are guaranteed by the Total Measurement
Error (VERR) specification.
Note 3: Due to the contact resistance of the production tester, this
specification is tested to relaxed limits. The 20Ω limit is guaranteed by
design.
Note 4: VCELL refers to the voltage applied across Cn to Cn – 1 for
n = 1 to 12. VTEMP refers to the voltage applied from VTEMP1 or VTEMP2
to V–.
Note 5: These absolute maximum ratings apply provided that the voltage
between inputs do not exceed the absolute maximum ratings.
Note 6: Supply current is tested during continuous measuring. The supply
current during periodic measuring (130ms, 500ms, 2s) is guaranteed by
design.
Note 7: The CDC = 5, 6 and 7 supply currents are not measured. They are
guaranteed by the CDC = 2 supply current measurement.
Note 8: Limit is determined by high speed automated test capability.
TYPICAL PERFORMANCE CHARACTERISTICS
Cell Measurement Error
vs Cell Input Voltage
4.5
TA = 125°C
3.0
TA = 85°C
TA = 25°C
TA = –40°C
1.5
0
–1.5
–3.0
–4.5
0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
CELL INPUT VOLTAGE (V)
680324 G01
Cell Measurement Error
vs Input RC Values
5
0
–5
–10
–15
C = 0µF
C = 0.1µF
–20
C = 1µF
C = 3.3µF
–25
CELL 1, 13ms CELL MEASUREMENT
REPETITION
VCELL = 3.3V
–30
01 2 3 45 6 7 8
INPUT RESISTANCE (kΩ)
9 10
680324 G02
Cell Measurement Error
vs Input RC Values
0
CELLS 2 TO 12, 13ms CELL
–5
MEASUREMENT REPETITION
VCELL = 3.3V
–10
–15
–20
–25
–30
0
C = 0µF
C = 0.1µF
C = 1µF
C = 3.3µF
12 3 456 7 8
INPUT RESISTANCE (kΩ)
9 10
680324 G03
680324f
5
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