ATF22V10BQL-25NM/883 データシートの表示（PDF） - Atmel Corporation

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ATF22V10BQL-25NM/883

High-performance Electrically Erasable Programmable Logic Device

Atmel Corporation 

Atmel ATF22V10B

3.1 DC Characteristics

Symbol Parameter

Condition

Min

Typ

Max

IIL

Input or I/O

Low Leakage Current

0 VIN 

VIL (Max)

IIH

Input or I/O

High Leakage Current

3.5 VIN VCC

-35

-100

10

ICC

Power Supply Current,

Standby

VCC = Max,

VIN = Max,

Outputs Open

B-7

Com.

Ind., Mil.

85

120

85

140

B-10

Com./Ind.

Mil.

85/85

85

120/140

140

B-15

ICC

Power Supply Current,

Standby

VCC = Max,

VIN = Max,

Outputs Open

B-25

Com./Ind.

Mil.

Com.

Ind., Mil.

65/65

65

65

65

90/115

115

90

115

BQ-15

Com.

35

55

Com.

BQL-20, -25

Ind., Mil.

5

10

5

15

Com.

B-7

Mil., Ind.

90

120

90

145

B-10

Com./Ind.

Mil.

90/90

90

120/145

150

ICC2

Clocked Power

Supply Current

VCC = Max,

Outputs Open,

f = 15MHz

B-15

B-25

Com./Ind.

Mil.

Com.

Ind., Mil.

65/65

65

65

65

90/120

150

90

120

BQ-15

Com.

40

60

Com.

BQL-20, -25

Ind., Mil.

20

50

20

70

IOS(1)

Output Short

Circuit Current

VOUT = 0.5V

-130

VIL

VIH

VOL

VOH

Notes:

Input Low Voltage

-0.5

0.8

Input High Voltage

2.0

VCC + 0.75

Output Low Voltage

VIN = VIH or VIL,

VCC = Min

IOL = 16mA

IOL = 12mA

Com., Ind.

Mil.

0.5

0.5

Output High Voltage

VIN = VIH or VIL,

VCC = Min

IOH = -4.0mA

2.4

1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec

2. The shaded devices are obsolete

Units

µA

µA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

V

V

V

V

V

3

0250M–PLD–7/10

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