TLE8209-2SA データシートの表示（PDF） - Infineon Technologies

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TLE8209-2SA

SPI Programmable H-Bridge

Infineon Technologies 

TLE8209-2SA

Power Supply

5.4

Electrical Characteristics Power Supply and VDD-Monitoring

Electrical Characteristics: Power Supply and VDD-Monitoring

VS = 5 V to 28 V; VDD = 5.0 V, Tj = -40 ⋅C to 150 ⋅C, all voltages with respect to ground, positive current flowing

into pin (unless otherwise specified)

Pos. Parameter

Symbol

Limit Values

Unit Test Conditions

Min. Typ. Max.

Supply

5.4.1 Supply Current

IVS

5.4.2

5.4.3

5.4.4

Functional Reset Threshold VDD_RES

Power On Reset Threshold VDD_POR

Power On Reset Delay

tPOR

Time

–

8

20

µA

IOUT = 0 A, VDD = 0V,

VS < 18 V, Tj < 125°C

–

2.1 4

mA bridge disabled,

IOUT = 0 A,

5 V < VS < 18 V

–

2.5 5

mA f = 2 kHz, IOUT = 0 A,

5 V < VS < 18 V

–

4

9

mA f = 10 kHz, IOUT = 0 A,

5 V < VS < 18 V

–

4.8 13

mA f = 10 kHz, IOUT = 0 A,

5 V < VS < 28 V

–

1.4 2.5 V

–

3.5 3.75 4.0 V

–

–

0.22 0.5

ms VDD = on --> output

stage active, no load

5.4.5

5.4.6

VDD Input current

VDDIO Input current

IDD

IDDIO

–

7

9

mA 4.5V < VDD < 5.5V

–

30

100 µA SPI-mode

no load at SO

no SPI communication

5.4.7 SF-mode Threshold

VDDIO_L

–

–

1.0 V

5.4.8 SPI-mode Threshold

VDDIO_H

2.0 –

–

V

5.4.9

Mode selection hysteresis VDDIO_HYS

0.2

0.5

1.0

V

VDD-Monitoring

5.4.10 Overvoltage threshold

VDD_THH

5.25 5.4 5.5 V

5.4.11 Undervoltage threshold

VDD_THL

4.2 4.3 4.4 V

5.4.12 Test mode reduced

Overvoltage threshold

VDD_TEST_H

4.2

4.3

4.4

V

–

–

–

Voltage referred to

GNDABE

5.4.13 Test mode increased

VDD_TEST_L 5.25 5.4

5.5

V

Undervoltage threshold

5.4.14 Filter time for glitch

tFIL

suppression

60

100 135 μs –

5.4.15 Maximum Slew Rate on VDD_slew

–

–

0.5 V/µs –

VDD1)

1) Not subject to production test; specified by design

Data Sheet

11

Rev. 1.2, 2012-12-20

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