74HC30D(2010) データシートの表示（PDF） - NXP Semiconductors.
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74HC30D Datasheet PDF : 16 Pages
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NXP Semiconductors
74HC30; 74HCT30
8-input NAND gate
VI 90 %
negative
pulse
GND
VI
positive
pulse
10 %
GND
VM
10 %
tf
tr
90 %
VM
VI
G
RT
tW
tW
VCC
DUT
VM
tr
tf
VM
VO
CL
001aah768
Fig 6.
Test data is given in Table 9.
Definitions for test circuit:
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Test circuit for measuring switching times
Table 9. Test data
Type
74HC30
74HCT30
Input
VI
VCC
3.0 V
tr, tf
6.0 ns
6.0 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
Test
tPLH, tPHL
tPLH, tPHL
74HC_HCT30_4
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 04 — 4 May 2010
© NXP B.V. 2010. All rights reserved.
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