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IDT54FCT534 データシートの表示(PDF) - Integrated Device Technology

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IDT54FCT534
IDT
Integrated Device Technology IDT
IDT54FCT534 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
IDT54/74FCT374/534/574/A/C
FAST CMOS OCTAL D REGISTERS (3-STATE)
PIN DESCRIPTION
Pin Names
DN
CP
ON
ON
OE
Description
D flip-flop data inputs.
Clock Pulse for the register. Enters data on
LOW-to-HIGH transition.
3-state outputs, (true).
3-state outputs, (inverted).
Active LOW 3-state Output Enable input.
2603 tbl 06
FUNCTION TABLE(1)
Inputs
Function
OE
CP
DN
Hi-Z
H
L
X
H
Load Register
L
L
H
H
uuuuH
X
L
H
L
H
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
MILITARY AND COMMERCIAL TEMPERATURE RANGES
FCT534
Outputs
Internal
ON
QN
Z
NC
Z
NC
H
L
L
H
Z
L
Z
H
Z = High Impedance
uNC = No Change
= LOW-to-HIGH transition
FCT374/574
Outputs
Internal
ON
QN
Z
NC
Z
NC
L
H
H
L
Z
H
Z
L
2603 tbl 05
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Rating
VTERM(2) Terminal Voltage
with Respect to
GND
VTERM(3) Terminal Voltage
with Respect to
GND
TA
Operating
Temperature
TBIAS Temperature
Under Bias
TSTG Storage
Temperature
Commercial
–0.5 to +7.0
–0.5 to VCC
0 to +70
–55 to +125
–55 to +125
Military Unit
–0.5 to +7.0 V
–0.5 to VCC V
–55 to +125 °C
–65 to +135 °C
–65 to +150 °C
PT
Power Dissipation
0.5
0.5
W
IOUT
DC Output
Current
120
120
mA
NOTES:
2603 tbl 01
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating con-
ditions for extended periods may affect reliability. No terminal voltage may
exceed VCC by +0.5V unless otherwise noted.
2. Input and VCC terminals only.
3. Outputs and I/O terminals only.
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter(1)
CIN
Input
Capacitance
COUT Output
Capacitance
Conditions Typ. Max. Unit
VIN = 0V
6
10 pF
VOUT = 0V
8
12 pF
NOTE:
2603 tbl 02
1. This parameter is measured at characterization but not tested.
7.13
3

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