74HCT157N データシートの表示（PDF） - NXP Semiconductors.

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74HCT157N

Quad 2-input multiplexer

NXP Semiconductors. 

NXP Semiconductors

74HC157; 74HCT157

Quad 2-input multiplexer

VI 90 %

negative

pulse

GND

VI

positive

pulse

10 %

GND

VM

10 %

tf

tr

90 %

VM

VI

G

RT

tW

tW

VCC

DUT

VM

tr

tf

VM

VO

CL

001aah768

Fig 9.

Test data is given in Table 9.

Definitions test circuit:

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

RL = Load resistance.

S1 = Test selection switch.

Test circuit for measuring switching times

Table 9. Test data

Type

74HC157

74HCT157

Input

VI

VCC

3.0 V

tr, tf

6.0 ns

6.0 ns

Load

CL

15 pF, 50 pF

15 pF, 50 pF

Test

tPLH, tPHL

tPLH, tPHL

74HC_HCT157

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 3 — 31 December 2010

© NXP B.V. 2010. All rights reserved.

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