85304-01 データシートの表示（PDF） - Integrated Device Technology

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85304-01

Low Skew, 1-to-5, Differential-to-3.3V LVPECL Fanout Buffer

Integrated Device Technology 

85304-01 Data Sheet

Table 4D. LVPECL DC Characteristics, VCC = 3.3V ± 5%, VEE =0V, TA = 0°C to 70°C

Symbol

Parameter

Test Conditions

Minimum

VOH

VOL

VSWING

Output High Current; NOTE 1

Output Low Current; NOTE 1

Peak-to-Peak Output Voltage

Swing

VCC – 1.4

VCC – 2.0

0.6

NOTE 1: Outputs terminated with 50 to VCC – 2V.

Typical

Maximum

VCC – 1.0

VCC – 1.7

0.85

Units

µA

µA

V

AC Electrical Characteristics

Table 5. AC Characteristics, VCC = 3.3V ± 5%, VEE =0V, TA = 0°C to 70°C

Symbol

Parameter

Test Conditions

fOUT

tPD

tsk(o)

Output Frequency

Propagation Delay; NOTE 1

Output Skew; NOTE 2, 3

ƒ 650MHz

tsk(pp)

Part-to-Part Skew; NOTE 3, 4

tR / tF

odc

Output Rise/Fall Time

Output Duty Cycle

20% to 80% @ 50MHz

Minimum

1.0

300

48

Typical

50

Maximum

650

2.1

35

150

700

52

Units

MHz

ns

ps

ps

ps

%

NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is

mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium

has been reached under these conditions.

NOTE: All parameters measured at 500MHz unless noted otherwise

NOTE: The cycle-to-cycle jitter on the input will equal the jitter on the output. The part does not add jitter.

NOTE 1: Measured from the differential input crossing point to the differential output crossing point. Measured at the output differential cross

points.

NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the output differential

cross points.

NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.

NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same frequency, same temperature and

with equal load conditions. Using the same type of inputs on each device, the outputs are measured at the differential cross points.

©2015 Integrated Device Technology, Inc

5

Revision E December 2, 2015

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