2192VE データシートの表示（PDF） - Lattice Semiconductor

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2192VE

3.3V In-System Programmable SuperFAST™ High Density PLD

Lattice Semiconductor 

Specifications ispLSI 2192VE

External Timing Parameters

Over Recommended Operating Conditions

PARAMETER

TEST 3

COND.

#

DESCRIPTION1

-225

-180

UNITS

MIN. MAX. MIN. MAX.

tpd1

A 1 Data Propagation Delay, 4PT Bypass, ORP Bypass

– 4.0 – 5.0 ns

tpd2

A 2 Data Propagation Delay

– 6.2 – 7.5 ns

fmax

A

3 Clock Frequency with Internal Feedback 2

225 – 180 – MHz

fmax (Ext.)

fmax (Tog.)

–

4

Clock

Frequency

with

External

Feedback

(1

tsu2 +

) tco1

– 5 Clock Frequency, Max. Toggle

150 – 125 –

250 – 200 –

MHz

MHz

tsu1

– 6 GLB Reg. Setup Time before Clock, 4 PT Bypass

2.5 – 3.5 – ns

tco1

A 7 GLB Reg. Clock to Output Delay, ORP Bypass

– 3.2 – 3.5 ns

th1

– 8 GLB Reg. Hold Time after Clock, 4 PT Bypass

0.0 – 0.0 – ns

tsu2

– 9 GLB Reg. Setup Time before Clock

3.5 – 4.5 – ns

tco2

A 10 GLB Reg. Clock to Output Delay

– 3.7 – 4.5 ns

th2

– 11 GLB Reg. Hold Time after Clock

0.0 – 0.0 – ns

tr1

A 12 Ext. Reset Pin to Output Delay

– 6.0 – 7.0 ns

trw1

– 13 Ext. Reset Pulse Duration

3.5 – 4.0 – ns

tptoeen

B 14 Input to Output Enable

– 6.0 – 10.0 ns

tptoedis

C 15 Input to Output Disable

– 6.0 – 10.0 ns

tgoeen

B 16 Global OE Output Enable

– 4.5 – 5.0 ns

tgoedis

C 17 Global OE Output Disable

– 4.5 – 5.0 ns

twh

– 18 External Synchronous Clock Pulse Duration, High

2.0 – 2.5 – ns

twl

– 19 External Synchronous Clock Pulse Duration, Low

2.0 – 2.5 – ns

1. Unless noted otherwise, all parameters use a GRP load of four, 20 PTXOR path, ORP and Y0 clock.

2. Standard 16-bit counter using GRP feedback.

3. Reference Switching Test Conditions section.

Table 2-0030A/2192VE

5

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