SPT7725BIQ データシートの表示（PDF） - Signal Processing Technologies

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SPT7725BIQ

8-BIT, 300 MSPS FLASH A/D CONVERTER

Signal Processing Technologies 

ELECTRICAL SPECIFICATIONS

TA=TMIN to TMAX, VEE=-5.2 V, RSource=50 Ω, VRBF=-2.00 V, VR2=-1.00 V, VRTF=0.00 V, fCLK=250 MHz, Duty Cycle=50%, unless otherwise specified.

PARAMETERS

Digital Inputs

Digital Input High Voltage

(MINV, LINV)

Digital Input Low Voltage

(MINV, LINV)

Clock Low Width, TPWL

Clock High Width, TPWH

Digital Output

Digital Output High Voltage

Digital Output Low Voltage

Power Supply Requirements

Supply Current

Power Dissipation

TEST

CONDITIONS

50 Ω to -2 V

50 Ω to -2 V

T = +25 °C

T = +25 °C

TEST

LEVEL

SPT7725A

SPT775B

MIN TYP MAX MIN TYP MAX UNITS

VI

-1.1

-0.7 -1.1

-0.7 Volts

VI

-2.0

-1.5 -2.0

-1.5 Volts

VI

2.2 2.0

2 1.8

ns

VI

2.2 2.0

2 1.8

ns

VI

-1.1

VI

-1.1

-1.5

Volts

-1.5 Volts

VI

425 550

425 550 mA

VI

2.2 2.9

2.2 2.9 W

TEST LEVEL CODES

TEST LEVEL

All electrical characteristics are subject to the

I

following conditions:

II

All parameters having min/max specifications

are guaranteed. The Test Level column indi-

III

cates the specific device testing actually per-

IV

formed during production and Quality Assur-

ance inspection. Any blank section in the data

V

column indicates that the specification is not

tested at the specified condition.

VI

Unless otherwise noted, all tests are pulsed

tests; therefore, TJ = TC = TA.

TEST PROCEDURE

100% production tested at the specified temperature.

100% production tested at TA=25 °C, and sample

tested at the specified temperatures.

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design

and characterization data.

Parameter is a typical value for information purposes

only.

100% production tested at TA = 25 °C. Parameter is

guaranteed over specified temperature range.

SPT

3

SPT7725

12/30/98

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