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SA639 データシートの表示(PDF) - Philips Electronics

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SA639 Datasheet PDF : 16 Pages
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Philips Semiconductors
Low voltage mixer FM IF system with filter amplifier
and data switch
Product specification
SA639
AC ELECTRICAL CHARACTERISTICS (Continued)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
SA639
UNITS
MIN
-3σ
TYP
+3σ
MAX
Post detection filter amplifier
Amplifier 3dB bandwidth
Amplifier gain
Slew rate
Input resistance
AC coupled: RL = 10k,
CL = 33pF
AC coupled: RL = 10k,
VOUT DC = 1.6V
AC coupled: RL = 10k,
CL = 33pF
11.7
12.8
13.8
-0.2
2.4
300
MHz
dB
V/µs
k
Input capacitance
3
pF
Output impedance
Output load resistance
Output load capacitance1
DC output level2
AC coupled
AC coupled
150
800
5
k
30
pF
1.5
1.682
1.7
1.718
1.9
V
Data switch
DC input voltage range3
1.2
1.6
2.0
V
AC input swing
Input impedance
400
100
mVP-P
k
Input capacitance
5
pF
Output load resistance
500
Through Mode (Pin 12 = LOW)
AC voltage gain4
-1.5
dB
Output drive capability
Slew rate
Static offset voltage5
Dynamic offset voltage2, 6
Sink/source, VOUT DC = 1.6V
3
VOUT DC = 1.6V
VIN DC = 1.2 to 2.0V
VIN DC = 1.4 to 2.0V;
VCC = 3.0 to 5.0V;
-7
RF level = -70 to -40 dBm
VIN DC = 1.4 to 2.0V;
VCC = 3.0 to 5.0V;
-10
RF level = -40 to -5 dBm
>14.0
-0.6
0.30
1.2
mA
V/µs
±5
mV
+7
mV
+10
Tri-State Mode (Pin 12 = HIGH)
Output leakage current
VOUT DC = 1.2 to 2.0V
9.5
20
30.5
100
nA
NOTES:
1. Includes filter feedback capacitance, comparator input capacitance. PCB stray capacitances and switch input capacitance.
2. Demodulator output DC coupled with Post Detection Filter Amplifier input and the demodulator tank exactly tuned to center frequency.
3. Includes DC offsets due to frequency offsets between Rx and Tx carrier and demodulator tank offset due to mis-tuning.
4. With a 400mVP-P sinusoid at 600kHz driving Pin 10. Output load resistance 500in series with 10nF.
5. With a DC input and capacitor in the RC load fully charged.
6. The switch is closed every 10ms for a duration of 40µs. The DC offset is determined by calculating the difference of 2 DC measurements,
which are determined as follows: 1) The first DC value is measured at the integrating capacitor of the switch when the switch is in the closed
position immediately before it opens. The value to be measured is in the middle of the peak-to-peak excursion of the superimposed
sine-wave. (DClow + (DChigh – DClow)/2). 2) The second DC value (calculated as above) is measured at Pin 11 immediately after the
switch opens, and is the DC value which gives the largest DC offset to the first DC measurement within a 400µs DECT burst. Minimum and
maximum limits are not tested, however, they are guaranteed by design and characterization using an optimized layout and application
circuit.
7. Standard deviations are measured based on application of 60 parts.
1998 Feb 10
5

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