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74LVC541AMTR データシートの表示(PDF) - STMicroelectronics

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74LVC541AMTR
ST-Microelectronics
STMicroelectronics ST-Microelectronics
74LVC541AMTR Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
74LVC541A
DYNAMIC SWITCHING CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
VCC
(V)
TA = 25 °C
Unit
Min. Typ. Max.
VOLP
VOLV
Dynamic Low Level Quiet Out-
put (note 1)
3.3
CL = 50pF
VIL = 0V, VIH = 3.3V
0.8
-0.8
V
1) Number of output defined as "n". Measured with "n-1" outputs switching from HIGH to LOW or LOW to HIGH. The remaining outputs is
measured in the LOW state.
AC ELECTRICAL CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
VCC
CL
RL ts = tr -40 to 85 °C
-55 to 125 °C Unit
(V)
(pF) () (ns) Min. Max. Min. Max.
tPLH tPHL Propagation Delay 1.65 to 1.95 30 1000 2.0
Time
2.3 to 2.7 30 500 2.0
ns
2.7
50 500 2.5 1.5
1.5
3.0 to 3.6 50 500 2.5
1
1
tPZL tPZH Output Enable Time 1.65 to 1.95 30 1000 2.0
2.3 to 2.7 30 500 2.0
2.7
50 500 2.5
1
ns
1
3.0 to 3.6 50 500 2.5
1
1
tPLZ tPHZ Output Disable Time 1.65 to 1.95 30 1000 2.0
2.3 to 2.7 30 500 2.0
2.7
50 500 2.5
2
ns
2
3.0 to 3.6 50 500 2.5
2
2
tOSLH
tOSHL
Output To Output
Skew Time (note1,
2)
2.7 to 3.6
1
1
ns
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device
switching in the same direction, either HIGH or LOW (tOSLH = | tPLHm - tPLHn|, tOSHL = | tPHLm - tPHLn|
2) Parameter guaranteed by design
CAPACITANCE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
VCC
(V)
TA = 25 °C
Unit
Min. Typ. Max.
CIN
Input Capacitance
4
pF
CPD Power Dissipation Capacitance
1.8
(note 1)
2.5
fIN = 10MHz
28
30
pF
3.3
34
1) CPD is defined as the value of the IC’s internal equivqlent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average current cqn be obtqined by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/n (per circuit)
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