MAL213635102E3 データシートの表示（PDF） - Vishay Semiconductors
部品番号
コンポーネント説明
メーカー
MAL213635102E3 Datasheet PDF : 11 Pages
| |||
Aluminum Capacitors
Radial Very Low Impedance
136 RVI
Vishay BCcomponents
3.8
IA 3.7
IR 3.6
3.5
3.4
3.3
3.2
3.1
3.0
CCC206
2.8
lifetime multiplier
2.6
2.4
2.2
2.0
IA = actual ripple current at 100 kHz
IR = rated ripple current at 100 kHz, 105 °C
(1) Useful life at 105 °C and IR applied; see Table 3
1.8
1.6
1.4
1.2
1.0
0.8
0.5
0.0
40
50
60
70
80
90
Table 4
Fig.14 Multiplier of useful life as a function of ambient temperature and ripple current load
(1)
100
110
Tamb (°C)
MULTIPLIER OF RIPPLE CURRENT (IR) AS A FUNCTION OF FREQUENCY
FREQUENCY
(Hz)
UR = 10 V
Ø ≤ 12.5
Ø ≥ 16
IR MULTIPLIER
UR = 16 and 25 V
UR = 35 and 50 V
Ø ≤ 12.5
Ø ≥ 16
Ø ≤ 12.5
Ø ≥ 16
100
300
1000
3000
10 000
30 000
100 000
0.70
0.83
0.63
0.69
0.50
0.60
0.80
0.90
0.72
0.79
0.61
0.71
0.88
0.95
0.80
0.87
0.72
0.80
0.92
0.98
0.88
0.92
0.81
0.88
0.96
0.99
0.92
0.96
0.88
0.93
0.99
1.00
0.98
0.99
0.94
0.96
1.00
1.00
1.00
1.00
1.00
1.00
UR = 63 and 100 V
Ø ≤ 12.5
Ø ≥ 16
0.35
0.50
0.51
0.64
0.66
0.74
0.76
0.83
0.85
0.90
0.92
0.95
1.00
1.00
Table 5
TEST PROCEDURES AND REQUIREMENTS
NAME OF TEST
TEST
REFERENCE
PROCEDURE
(QUICK REFERENCE)
Endurance
IEC 60384-4/
EN130 300
subclause 4.13
Tamb = 105 °C; UR applied;
for test duration see Table 3
Useful life
CECC 30301
subclause 1.8.1
Tamb = 105 °C; UR and IR applied;
for test duration see Table 3
Shelf life
(storage at high
temperature)
IEC 60384-4/
EN130 300
subclause 4.17
Tamb = 105 °C; no voltage applied;
1000 hours
after test: UR to be applied for 30 minutes,
24 to 48 hours before measurement
REQUIREMENTS
ΔC/C: ± 20 %
tan δ ≤ 2 x spec. limit
IL2 ≤ spec. limit
ΔC/C: ± 30 %
tan δ ≤ 3 x spec. limit
IL2 ≤ spec. limit
no short or open circuit
total failure percentage: ≤ 1 %
ΔC/C: ± 20 %
tan δ ≤ 2 x spec. limit
IL2 ≤ spec. limit
Document Number: 28321
Revision: 21-Dec-07
For technical questions contact: aluminumcaps1@vishay.com
www.vishay.com
139
Share Link: 