EMIF01-10018W5 データシートの表示（PDF） - STMicroelectronics

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EMIF01-10018W5

EMI FILTER INCLUDING ESD PROTECTION

STMicroelectronics 

EMIF01-10018W5

CROSSTALK BEHAVIOR

1- Crosstalk phenomena

Fig. A7: Crosstalk phenomena

RG1

VG1

RG2

VG2

line 1

line 2

α1VG1 + β12VG2

RL1

RL2

α2VG2 + β21VG1

DRIVERS

RECEIVERS

The crosstalk phenomena are due to the coupling between 2 lines. The coupling factor ( β12 or β21 ) increases when the

gap across lines decreases, particularly in silicon dice. In the example above the expected signal on load RL2 is α2VG2, in

fact the real voltage at this point has got an extra value β21VG1. This part of the VG1 signal represents the effect of the

crosstalk phenomenon of the line 1 on the line 2. This phenomenon has to be taken into account when the drivers impose

fast digital data or high frequency analog signals in the disturbing line. The perturbed line will be more affected if it works

with low voltage signal or high load impedance (few kΩ). The following chapters give the value of both digital and analog

crosstalk.

2- Digital Crosstalk

Fig. A8: Digital crosstalk measurement

+5V

74HC04

Line 1

Square

+5V

Pulse

Generator

5KHz

VG1

Line 2

+5V

74HC04

EMIF01

10018W5

β21 VG1

Figure A8 shows the measurement circuit used to quantify the crosstalk effect in a classical digital application.

Figure A9 shows that in such a condition signal from 0 to 5V and rise time of few ns, the impact on the disturbed line is less

than 50mV peak to peak. No data disturbance was noted on the concerned line.The measurements performed with falling

edges gives an impact within the same range.

Fig. A9: Digital crosstalk results

6/10

VG1

β21VG1

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