ACPL-P456-500E データシートの表示（PDF） - Broadcom Corporation

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ACPL-P456-500E

High CMR Intelligent Power Module and Gate Drive Interface Optocoupler

Broadcom Corporation 

ACPL-P456 and ACPL-W456

Data Sheet

Notes:

1. Derate linearly above 90°C free-air temperature at a rate of 0.8 mA/°C.

2. Derate linearly above 90°C free-air temperature at a rate of 1.6 mA/°C.

3. Derate linearly above 90°C free-air temperature at a rate of 3.0 mA/°C.

4. Derate linearly above 90°C free-air temperature at a rate of 4.2 mA/°C.

5. CURRENT TRANSFER RATIO in percent is defined as the ratio of output collector current (IO) to the forward LED input current (IF) times 100.

6. Device considered a two-terminal device: Pins 1 and 3 shorted together and Pins 4, 5, and 6 shorted together.

7. In accordance with UL1577, each optocoupler is proof tested by applying an insulation test voltage. 4500VRMS for 1 second (leakage

detection current limit, II-O ≤ 5 μA); each optocoupler under ACPL-W456 is proof tested by applying an insulation test voltage. 6000VRMS

for 1 second (leakage detection current limit, II-O ≤ 5 μA).

8. Pulse: f = 20 kHz, Duty Cycle = 10%.

9. Use of a 0.1 μF bypass capacitor connected between pins 4 and 6 can improve performance by filtering power supply line noise.

10. The difference between tPLH and tPHL between any two parts under the same test condition. (See IPM Dead Time and Propagation Delay

Specifications section.)

11. Common mode transient immunity in a Logic High level is the maximum tolerable dVCM/dt of the common mode pulse, VCM, to assure that

the output will remain in a Logic High state (i.e., VO > 3.0V).

12. Common mode transient immunity in a Logic Low level is the maximum tolerable dVCM/dt of the common mode pulse, VCM, to assure that

the output will remain in a Logic Low state (i.e., VO < 1.0V).

13. Pulse Width Distortion (PWD) is defi ned as |tPHL – tPLH| for any given device.

Broadcom

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