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ACPL-P480-060E データシートの表示(PDF) - Broadcom Corporation

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ACPL-P480-060E Datasheet PDF : 11 Pages
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ACPL-P480 and ACPL-W480
High CMR Intelligent Power Module and Gate Drive
Interface Optocoupler
Data Sheet
Description
The high-speed ACPL-P480/W480 optocoupler contains a
GaAsP LED, a photo detector, and a Schmitt trigger that
eliminates the requirement for external waveform
conditioning circuits. The totem pole output eliminates the
need for a pull-up resistor and allows for a direct-drive
Intelligent Power Module or gate drive. Propagation delay
difference between devices has been minimized to maximize
inverter efficiency through reduced switching dead time.
Applications
IPM Interface Isolation
Isolated IGBT/MOSFET Gate Drive
AC and Brushless DC Motor Drives
Industrial Inverters
General Digital Isolation
Functional Diagram
ANODE 1
N.C. 2
CATHODE 3
SHIELD
6 VCC
5 VO
4 Ground
Note: A 0.1 μF bypass capacitor must be connected between
pins 4 and 6.
Truth Table (Non-Inverting Logic)
LED
V0
ON
HIGH
OFF
LOW
Features
Performance Specified for Common IPM Applications Over
Industrial Temperature Range
Short Maximum Propagation Delays
Minimized Pulse Width Distortion (PWD)
Very High Common Mode Rejection (CMR)
Hysteresis
Totem Pole Output (No Pull-up Resistor Required)
Available in Stretched SO-6 Package
Package Clearance/Creepage at 8 mm (ACPL-W480)
Safety Approval:
UL Recognized with 3750VRMS for 1 minute (5000VRMS
for 1 minute for all ACPL-W480 devices and Option 020
device for ACPL-P480) per UL1577
CSA Approved
IEC/EN/DIN EN 60747-5-5 approved with VIORM =
891Vpeak for ACPL-P480 and VIORM = 1140Vpeak for
ACPL-W480
Specifications
Wide Operating Temperature Range: –40°C to 100°C
Maximum Propagation Delay tPHL/tPLH = 350 ns
Maximum Pulse Width Distortion (PWD) = 250 ns
Propagation Delay Difference: Min. –100 ns, Max. 250 ns
Wide Operating VCC Range: 4.5V to 20V
20 kV/μs Minimum Common Mode Rejection (CMR) at VCM
= 1000V
CAUTION
It is advised that normal static precautions be
taken in handling and assembly of this
component to prevent damage and/or
degradation which may be induced by ESD.
Broadcom
-1-

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