29F010 データシートの表示（PDF） - STMicroelectronics

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29F010

1 Mbit (128Kb x8, Uniform Block) Single Supply Flash Memory

STMicroelectronics 

Table 8. AC Measurement Conditions

Parameter

AC Test Conditions

Load Capacitance (CL)

Input Rise and Fall Times

Input Pulse Voltages

Input and Output Timing Ref. Voltages

M29F010B

45

High Speed

30pF

≤10ns

0 to 3V

1.5V

M29F010B

70 / 90 / 120

Standard

100pF

≤10ns

0.45 to 2.4V

0.8V and 2V

Figure 6. AC Testing Input Output Waveform

High Speed

3V

0V

Standard

2.4V

0.45V

1.5V

2.0V

0.8V

AI01275B

Figure 7. AC Testing Load Circuit

1.3V

1N914

DEVICE

UNDER

TEST

3.3kΩ

OUT

CL = 30pF or 100pF

CL includes JIG capacitance

AI03027

Table 9. Capacitance

(TA = 25 °C, f = 1 MHz)

Symbol

Parameter

CIN

Input Capacitance

COUT

Output Capacitance

Note: Sampled only, not 100% tested.

Test Condition

VIN = 0V

VOUT = 0V

Min

Max

Unit

6

pF

12

pF

11/20

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