CAT93C76(2004) データシートの表示（PDF） - Catalyst Semiconductor => Onsemi
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CAT93C76 Datasheet PDF : 10 Pages
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CAT93C76
PIN CAPACITANCE
Symbol
Test
Conditions Min
Typ
Max Units
COUT(1)
Output Capacitance (DO)
VOUT=0V
5
pF
CIN(1)
Input Capacitance (CS, SK, DI, ORG)
VIN=0V
5
pF
INSTRUCTION SET(2)
Instruction
READ
ERASE
WRITE
EWEN
EWDS
ERAL
WRAL
Start Bit
1
1
1
1
1
1
1
Address
Opcode
x8
x16
10
A10-A0
A9-A0
11
A10-A0
A9-A0
01
A10-A0
A9-A0
00
11XXXXXXXXX 11XXXXXXXX
00
00XXXXXXXXX 00XXXXXXXX
00
10XXXXXXXXX 10XXXXXXXX
00
01XXXXXXXXX 01XXXXXXXX
Data
x8
x16
Comments
Read Address AN– A0
Clear Address AN– A0
D7-D0 D15-D0 Write Address AN– A0
Write Enable
Write Disable
Clear All Addresses
D7-D0 D15-D0 Write All Addresses
A.C. CHARACTERISTICS
Symbol Parameter
Test
Conditions
tCSS CS Setup Time
tCSH CS Hold Time
tDIS DI Setup Time
tDIH DI Hold Time
tPD1 Output Delay to 1
tPD0
tHZ(1)
Output Delay to 0
Output Delay to High-Z
CL = 100pF
(3)
tEW Program/Erase Pulse Width
tCSMIN Minimum CS Low Time
tSKHI Minimum SK High Time
tSKLOW Minimum SK Low Time
tSV Output Delay to Status Valid
SKMAX Maximum Clock Frequency
Limits
VCC =
1.8V-2.5V
VCC =
2.5V-5.5V
Min
Max
100
0
100
100
250
250
150
5
200
250
250
250
DC
1000
Min
Max
50
0
50
50
150
150
100
5
150
150
150
100
DC
3000
NOTE:
(1) These parameters are tested initially and after a design or process change that affects the parameter.
(2) Address bit A10 for the 1,024x8 org. and A9 for the 512x16 org. are “don’t care” bits, but must be kept at either a “1” or
“0” for READ, WRITE and ERASE commands.
(3) The input levels and timing reference points are shown in the “AC Test Conditions” table.
Units
ns
ns
ns
ns
ns
ns
ns
ms
ns
ns
ns
ns
kHz
3
Doc. No. 1090, Rev. A
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