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CY7C1046BN データシートの表示(PDF) - Cypress Semiconductor

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CY7C1046BN
Cypress
Cypress Semiconductor Cypress
CY7C1046BN Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
CY7C1046BN
Maximum Ratings
Exceeding maximum ratings may impair the useful life of the
device. User guidelines are not tested.
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage on VCC Relative to GND[1] .... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High-Z State[1] ....................................–0.5V to VCC + 0.5V
DC Input Voltage[1].................................–0.5V to VCC + 0.5V
Electrical Characteristics Over the Operating Range
Current into Outputs (LOW)......................................... 20 mA
Static Discharge Voltage............................................ >2001V
(in accordance with MIL-STD-883, Method 3015)
Latch-Up Current ..................................................... >200 mA
Operating Range
Range
Commercial
Ambient
Temperature[2]
0°C to +70°C
VCC
4.5V–5.5V
Parameter
Description
Test Conditions
VOH
Output HIGH Voltage
VCC = Min, IOH = –4.0 mA
VOL
Output LOW Voltage
VCC = Min, IOL = 8.0 mA
VIH
Input HIGH Voltage
VIL
Input LOW Voltage[1]
IIX
Input Load Current
GND < VI < VCC
IOZ
Output Leakage Current
GND < VOUT < VCC, Output Disabled
ICC
VCC Operating Supply Current VCC = Max, f = fMAX = 1/tRC
ISB1
Automatic CE Power Down
Max VCC, CE > VIH, VIN > VIH or
Current – TTL Inputs
VIN < VIL, f = fMAX
ISB2
Automatic CE Power Down
Max VCC, CE > VCC – 0.3V,
Current – CMOS Inputs
VIN > VCC – 0.3V, or VIN < 0.3V, f = 0
7C1046BN-15
Min
Max
Unit
2.4
V
0.4
V
2.2
–0.3
VCC + 0.3
V
0.8
V
–1
+1
mA
–1
+1
mA
150
mA
20
mA
8
mA
Capacitance[3]
Parameter
CIN
COUT
Description
Input Capacitance
IO Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
VCC = 5.0V
Max
Unit
6
pF
6
pF
Notes
1. VIL (min) = –2.0V for pulse durations of less than 20 ns.
2. TA is the “Instant On” case temperature.
3. Tested initially and after any design or process changes that may affect these parameters.
Document #: 001-11924 Rev. **
Page 2 of 9
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