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ADF41020BCPZ-RL7(Rev0) データシートの表示(PDF) - Analog Devices

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ADF41020BCPZ-RL7
(Rev.:Rev0)
ADI
Analog Devices ADI
ADF41020BCPZ-RL7 Datasheet PDF : 16 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Data Sheet
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 3.
Parameter
AVDD to GND
AVDD to DVDD
VP to GND
VP to AVDD
Digital I/O Voltage, REFIN to GND
Analog I/O Voltage to GND
REFIN, RFIN to GND
Operating Temperature Range
Industrial
Storage Temperature Range
Maximum Junction Temperature
LFCSP θJA Thermal Impedance1
(Paddle Soldered)
Reflow Soldering
Peak Temperature
Time at Peak Temperature
Transistor Count
CMOS
Bipolar
Rating
−0.3 V to +3.9 V
−0.3 V to +0.3 V
−0.3 V to +3.9 V
−0.3 V to +0.3 V
−0.3 V to DVDD + 0.3 V
−0.3 V to VP + 0.3 V
−0.3 V to AVDD + 0.3 V
−40°C to +85°C
−65°C to +125°C
150°C
62.82°C/W
260°C
40 sec
6610
358
1 Two signal planes (that is, on the top and bottom surfaces of the board), two
buried planes, and four vias.
ADF41020
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
This device is a high performance RF integrated circuit with an
ESD rating of <2 kV, and it is ESD sensitive. Proper precautions
should be taken for handling and assembly.
ESD CAUTION
Rev. 0 | Page 5 of 16

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