CF52005-3.0 データシートの表示（PDF） - Altera Corporation
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CF52005-3.0 Datasheet PDF : 26 Pages
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Page 20
Operating Conditions
Table 15. EPC1064, EPC1064V, and EPC1213 Devices ICC Supply Current Values
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
ICC0
VCC supply current (standby)
—
—
100
200
A
ICC1
VCC supply current (during configuration)
—
—
10
50
mA
Table 16. EPC2 Device Values
Symbol
ICC0
ICC1
RCONF
Parameter
VCC supply current (standby)
VCC supply current (during
configuration)
Configuration pins
Conditions
VCC = 5.0 V or 3.3 V
VCC = 5.0 V or 3.3 V
Internal pull up (OE, nCS,
nINIT_CONF)
Min
Typ
Max
Unit
—
50
100
µA
—
18
50
mA
—
1
—
k
Table 17. EPC1 Device ICC Supply Current Values
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
ICC0
VCC supply current (standby)
—
—
ICC1
VCC supply current (during configuration)
VCC = 5.0 V
VCC = 3.3 V
—
—
50
100
µA
30
50
mA
10
16.5
mA
Table 18. EPC1441 Device ICC Supply Current Values
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
ICC0
VCC supply current (standby)
—
—
30
60
µA
ICC1
VCC supply current (during configuration) VCC = 5.0 V
—
15
30
mA
ICC1
VCC supply current (during configuration) VCC = 3.3 V
—
5
10
mA
Table 19. Capacitance (7)
Symbol
Parameter
Conditions
Min
Max
Unit
CIN
Input pin capacitance
VIN = 0 V, f = 1.0 MHz
—
10
pF
CO UT
Output pin capacitance
VOUT = 0 V, f = 1.0 MHz
—
10
pF
Notes to Table 12 through Table 19:
(1) For more information, refer to the Operating Requirements for Altera Devices Datasheet.
(2) The minimum DC input is -0.3 V. During transitions, the inputs may undershoot to -2.0 V or overshoot to 7.0 V for input currents less than
100 mA and periods shorter than 20 ns under no-load conditions.
(3) Numbers in parentheses are for industrial temperature range devices.
(4) Maximum VCC rise time is 100 ms.
(5) Certain EPC2 device pins are driven to 5.75 V when operated with a 3.3-V VCC. For more information, refer to Table 4 on page 11.
(6) The IOH parameter refers to high-level TTL or CMOS output current and the IOL parameter refers to low-level TTL or CMOS output current.
(7) Capacitance is sample tested only.
Configuration Devices for SRAM-Based LUT Devices
January 2012 Altera Corporation
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