FDD6635 データシートの表示（PDF） - Fairchild Semiconductor

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FDD6635

35V N-Channel PowerTrench® MOSFET

Fairchild Semiconductor 

Test Circuits and Waveforms

VDS

VGS

RGEN

0V

VGS

tp

vary tP to obtain

required peak IAS

L

DUT

IAS

0.01Ω

+

VDD

-

Figure 14. Unclamped Inductive Load Test

Circuit

Drain Current Regulator

Same type as DUT

+

10V

50kΩ

-

10μF

1μF

VGS

DUT

+

VDD

-

Ig(REF)

tP

IAS

BVDSS

VDS

VDD

tAV

Figure 15. Unclamped Inductive Waveforms

10V

QG

VGS

QGS

QGD

Charge, (nC)

Figure 16. Gate Charge Test Circuit

VDS

VGS

RGEN

VGS Pulse Width ≤ 1μs

Duty Cycle ≤ 0.1%

RL

DUT

+

VDD

-

Figure 18. Switching Time Test Circuit

Figure 17. Gate Charge Waveform

VDS

tON

td(ON)

tr

90%

tOFF

td(OFF)

tf

90%

0V

VGS

10%

0V

10%

50%

Pulse Width

10%

90%

50%

Figure 19. Switching Time Waveforms

FDD6635 Rev. C2(W)

www.fairchildsemi.com

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