M29F200BB データシートの表示（PDF） - Micron Technology

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M29F200BB

2 Mbit 256Kb x8 or 128Kb x16 / Boot Block Single Supply Flash Memory

Micron Technology 

M29F200BT, M29F200BB

Figure 7. AC testing load circuit

1.3V

1N914

DC and ac parameters

DEVICE

UNDER

TEST

3.3kΩ

OUT

CL = 30pF or 100pF

CL includes JIG capacitance

AI03027

Table 11. DC characteristics (TA = 0 to 70°C, –40 to 85°C or –40 to 125°C)

Symbol

Parameter

Test Condition

Min Typ(1) Max Unit

ILI Input Leakage Current

ILO Output Leakage Current

ICC1 Supply Current (Read)

0V ≤ VIN ≤ VCC

0V ≤ VOUT ≤ VCC

E = VIL, G = VIH,

f = 6MHz

±1

µA

±1

µA

6

20

mA

ICC2 Supply Current (Standby) TTL

ICC3

Supply Current (Standby)

CMOS

ICC4(2)

Supply Current

(Program/Erase)

E = VIH

E = VCC ±0.2V,

RP = VCC ±0.2V

Program/Erase

Controller active

1

mA

30

100

µA

20

mA

VIL Input Low Voltage

VIH Input High Voltage

VOL Output Low Voltage

Output High Voltage TTL

VOH

Output High Voltage CMOS

VID

IID

VLKO(2)

Identification Voltage

Identification Current

Program/Erase Lockout Supply

Voltage

IOL = 5.8mA

IOH = –2.5mA

IOH = –100µA

A9 = VID

–0.5

2

2.4

VCC –0.4

11.5

3.2

0.8

V

VCC +0.5 V

0.45

V

V

V

12.5

V

100

µA

4.2

V

1. TA = 25°C, VCC = 5V.

2. Sampled only, not 100% tested.

29/39

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