AD9870 データシートの表示（PDF） - Analog Devices

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AD9870

IF Digitizing Subsystem

Analog Devices 

AD9870

Address Bit

(Hex) Breakdown

Width Default Value Name

Description

CLOCK SYNTHESIZER (Continued)

0x13 (7:0)

8

0x3C

CKN(7:0)

Synthesized Frequency Divisor (8 LSBs of a 13-Bit Word).

Default Yields 300 kHz from fCLK = 18 MHz.

Min = 3, Max = 8191.

0x14

(6)

(5)

(4:2)

(1:0)

1

0

1

0

3

0

2

0

CKF

CKINV

CKI

CKTM

Enable Fast Acquire.

Invert Charge Pump (0 = Pump_Up ⇒ IOUTC Sources Current).

Charge Pump Current in Normal Operation. IPUMP = (CKI + 1) × 0.625 mA.

Manual Control of CLK Charge Pump (0 = Off, 1 = Down, 2 = Up, 3 = Normal).

0x15 (3:0)

4

0x0

CKFA(13:8) CK Fast Acquire Time Unit (4 MSBs of a 14-Bit Word).

0x16 (7:0)

8

0x04

CKFA(7:0) CK Fast Acquire Time Unit (8 LSBs of a 14-Bit Word).

SSI CONTROL

0x18 (7:0)

8

0x12

SSICRA

SSI Control Register A. See Table III.

(Default is FS and CLKOUT Three-Stated.)

0x19 (1:0)

2

0x0

SSICRB

SSI Control Register B. See Table III.

0x1A (3:0)

4

1

AAF CAPACITOR SETTING/CALIBRATION

SSIORD

Output Rate Divisor. fCLKOUT = fCLK/SSIORD.

0x1C (7:0)

8

0x00

AAR

Antialias Response Selector. 0x60 Is Recommended.

0x1D

5

(4:0)

1

0

5

0x0

ERRN

CAPN

Error Flag.

AAF N-Well Capacitor Setting.

0x1E

5

(4:0)

1

0

15

0x0

ERRP

CAPP

Error Flag.

AAF Poly-Poly Capacitor Setting.

TEST REGISTERS AND SPI PORT READ ENABLE

0x38 (7:0)

8

0x00

TEST

Factory Test Mode.

0x39 0

1

0

TEST

Factory Test Mode.

0x3A

(7:4, 2:0)

(3)

7

0x0

1

0

TEST

SPIREN

Factory Test Mode.

Enable Read from SPI Port.

0x3B– (7:0)

0x3F

1

0x00

TEST

Factory Test Mode.

–6–

REV. 0

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