SI4362 データシートの表示（PDF） - Silicon Laboratories

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SI4362

HIGH-PERFORMANCE, LOW-CURRENT RECEIVER

Silicon Laboratories 

Si4362

1.1. Definition of Test Conditions

Production Test Conditions:

TA = +25 °C.

VDD = +3.3 VDC.

External reference signal (XOUT) = 1.0 VPP at 30 MHz, centered around 0.8 VDC.

Production test schematic (unless noted otherwise).

All RX input levels are referred to the input of a tuned balun connected to the RX input pins of the Si4362.

Qualification Test Conditions:

TA = –40 to +85 °C (Typical TA = 25 °C).

VDD = +1.8 to +3.6 VDC (Typical VDD = 3.3 VDC).

Using RX reference design or production test schematic.

All RF input and output levels referred to the pins of the Si4362 (not the RF module).

Rev 0.4

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