935267050025 データシートの表示（PDF） - Philips Electronics

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935267050025

I•CODE1 Label IC (97pF) Chip Specification

Philips Electronics 

Product Specification

SL1 ICS31 01

15 Inlet/Label Characterisation and Test

Rev. 1.2

15.1 Characterisation of the Inlet/Label

The parameters recommended to be characterised for the inlet/label are:

Parameter

Threshold field strength for

UNSELECTED READ command

(standard mode)

Threshold resonance frequency

Threshold field strength for WRITE

command

(standard mode)

Symbol Conditions

HTRead UNSELECTED READ command OK

fRT

HTWrite

Resonance frequency @ HTRead

No command transmitted to the inlet/label à

Label generates no response à No modulation

WRITE (and Verifying READ) command OK

For more detailed information on inlet /label characterisation please refer to Philips application note

‘I•CODE Label IC, Coil Design Guide’.

15.2 Final Test of the Inlet/Label

Basic flow for production and test:

1. Production of wafer

2. Testing of dies on wafer

3. Writing of serial numbers and pre-configuration

4. Sawing of wafer

5. Assembly of inlets/labels

6. Final test of inlets/labels

7. Writing of customer data

To detect damage of EEPROM cells during production of inlets/labels a final test of the

EEPROM after assembly of the inlet/label is recommended. This is necessary to achieve

lowest failure rates.

July 2000

Page 17 of 22

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