M29W008B データシートの表示（PDF） - STMicroelectronics

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M29W008B

8 Mbit (1Mb x8, Boot Block) Low Voltage Single Supply Flash Memory

STMicroelectronics 

M29W008T, M29W008B

Table 11. AC Measurement Conditions

Input Rise and Fall Times

≤ 10ns

Input Pulse Voltages

0 to 3V

Input and Output Timing Ref. Voltages

1.5V

Figure 4. AC Testing Input Output Waveform

3V

1.5V

0V

AI01417

Figure 5. AC Testing Load Circuit

0.8V

1N914

DEVICE

UNDER

TEST

3.3kΩ

OUT

CL = 30pF or 100pF

CL includes JIG capacitance

AI01968

Table 12. Capacitance (1) (TA = 25 °C, f = 1 MHz )

Symbol

Parameter

Test Condition

CIN

Input Capacitance

COUT

Output Capacitance

Note: 1. Sampled only, not 100% tested.

VIN = 0V

VOUT = 0V

Min

Max

Unit

6

pF

12

pF

Table 13. DC Characteristics

(TA = 0 to 70°C, –20 to 85°C or –40 to 85°C; VCC = 2.7V to 3.6V)

Symbol

Parameter

Test Condition

ILI

ILO

ICC1

ICC3

ICC4 (1)

Input Leakage Current

Output Leakage Current

Supply Current (Read) Byte

Supply Current (Standby)

Supply Current (Program or Erase)

0V ≤ VIN ≤ VCC

0V ≤ VOUT ≤ VCC

E = VIL, G = VIH, f = 6MHz

E = VCC ± 0.2V

Byte program, Block or

Chip Erase in progress

VIL

Input Low Voltage

VIH

Input High Voltage

VOL Output Low Voltage

VOH Output High Voltage CMOS

VID

A9 Voltage (Electronic Signature)

IID

A9 Current (Electronic Signature)

VLKO

Supply Voltage (Erase and

Program lock-out)

Note: 1. Sampled only, not 100% tested.

IOL = 1.8mA

IOH = –100µA

A9 = VID

Min

–0.5

0.7 VCC

VCC –0.4V

11.5

2.0

Max

±1

±1

10

100

20

0.8

VCC + 0.3

0.45

12.5

100

2.3

Unit

µA

µA

mA

µA

mA

V

V

V

V

V

µA

V

14/30

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