28F256L30 データシートの表示（PDF） - Numonyx -> Micron

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28F256L30

Numonyx™ StrataFlash® Wireless Memory(L30)

Numonyx -> Micron 

Numonyx™ StrataFlash® Wireless Memory (L30)

7.0

AC Characteristics

7.1

AC Test Conditions

Figure 8: AC Input/Output Reference Waveform

VCCQ

Input VCCQ/2

Test Points

VCCQ/2 Output

0V

IO_REF.WMF

Note: AC test inputs are driven at VCCQ for Logic "1" and 0.0 V for Logic "0." Input/output timing begins/ends at VCCQ/2. Input

rise and fall times (10% to 90%) < 5 ns. Worst case speed occurs at VCC = VCCMin.

Figure 9: Transient Equivalent Testing Load Circuit

Device

Under Test

Out

CL

Notes:

1.

See the following table for component values.

2.

Test configuration component value for worst case speed conditions.

3.

CL includes jig capacitance

.

Table 11: Test configuration component value for worst case speed conditions

Test Configuration

2.0 V Standard Test

CL (pF)

30

Figure 10: Clock Input AC Waveform

VIH

CLK [C]

VIL

R202

R201

R203

November 2007

Order Number: 251903-11

Datasheet

25

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