IDT49C460 データシートの表示（PDF） - Integrated Device Technology
部品番号
コンポーネント説明
メーカー
IDT49C460 Datasheet PDF : 32 Pages
| |||
IDT49C460/A/B/C/D/E
32-BIT CMOS ERROR DETECTION AND CORRECTION UNIT
MILITARY AND COMMERCIAL TEMPERATURE RANGES
IDT49C460D AC ELECTRICAL CHARACTERISTICS
(Guaranteed Commercial Range Performance) Temperature range: 0°C to +70°C, VCC = 5.0V ± 5%
The inputs switch between 0V to 3V with signal measured at the 1.5V level.
PROPAGATION DELAYS(1)
From Input
SC0–7
To Output
DATA0–31
ERROR
MULT ERROR
DATA0–31 (3)
14
18(2)
12
15
CB0–7 (CODE ID1,0 = 00, 11)
11
16
10
12
CB0–7 (CODE ID1,0 = 10)
LEOUT/GENERATE
12
u
—
d
14
12
—
—
9
d7d8
—
u7u8
CORRECT
Not Internal Control Mode
—
12
—
—
DIAG MODE
Not Internal Control Mode
CODE ID1,0
12
20
10
15
14(6)
18
13
16
LEIN
17
21
14
17
From latched to Transparent
LEDIAG
u
12(6)
18
12
14
From latched to Transparent
u Internal LEDIAG (Internal Control Mode) From
12(6)
17
12
14
Control latched to Transparent
Mode DATA0–31 (Internal Control Mode)
u
12
19(2)
10
12
Via Diagnostic Latch
SET-UP AND HOLD TIMES RELATIVE TO LATCH ENABLES
From Input
DATA0–31 (4)
CB0–7 (4)
DATA0–31(4, 6)
CB0–7 (CODE ID 00, 11)(4, 6)
CB0–7 (CODE ID 10)(4, 6)
CORRECT(4, 6)
DIAG MODE(4, 6)
CODE ID1,0(4, 6)
LEIN(4, 6)
To Input
(Latching Data)
d
d
d
d
d
ud
d
d
ud
LEIN
LEIN
LEOUT/GENERATE
LEOUT/GENERATE
LEOUT/GENERATE
LEOUT/GENERATE
LEOUT/GENERATE
LEOUT/GENERATE
LEOUT/GENERATE
DATA0–31(4, 6)
LEDIAG
NOTE: (15) above applies to correction path.
OUTPUT ENABLE/DISABLE TIMES(5)
Set-up Time
Min.
3
2
5(15)
11
6
6
13
8
14
3
Hold Time
Min.
3
3
0
0
0
0
0
0
0
3
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
2584 tbl 28
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
2584 tbl 29
Enable
Disable
From Input
OE Byte0–3
OESC
Enable
d
d
Disable
u
u
To Output
DATA0–31
SC0–7
Min. Max. Min. Max. Unit
0
8
0
10
ns
0
8
0
10
ns
(6)
MINIMUM PULSE WIDTHS
ud LEIN, LEOUT/GENERATE, LEDIAG
(Positive–going pulse)
Min.
5
2584 tbl 30
ns
NOTES:
2584 tbl 31
1. CI = 50pF.
2. These parameters are combinational propagation delay calculations, and are not tested in production.
3. Data In or Correct Data Out measurement requires timing as shown in the Switching Waveforms.
4. Set-up and Hold times relative to Latch Enables (Latching Data).
5. Output tests specified with CI = 5pF and measured to 0.5V change of output level. Testing is performed at CI = 50pF and correlated to CI = 5pF.
6. Not production tested, guaranteed by characterization.
11.6
19
Share Link: 