IDT49C460 データシートの表示（PDF） - Integrated Device Technology
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IDT49C460 Datasheet PDF : 32 Pages
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IDT49C460/A/B/C/D/E
32-BIT CMOS ERROR DETECTION AND CORRECTION UNIT
MILITARY AND COMMERCIAL TEMPERATURE RANGES
IDT49C460D AC ELECTRICAL CHARACTERISTICS
(Guaranteed Military Range Performance) Temperature range: –55°C to +125°C, VCC = 5.0V ± 10%
The inputs switch between 0V to 3V with signal measured at the 1.5V level.
PROPAGATION DELAYS(1)
From Input
DATA0–3(3)
CB0–7 (CODE ID1,0 = 00, 11)
CB0–7 (CODE ID1,0 = 10)
LEOUT/GENERATE
SC0–7
17
13
ud
13
—
15
To Output
DATA0–31
ERROR
22(2)
16
17
12
14
10
—
du
—
8
8
MULT ERROR Unit
18
ns
14
ns
du
—
8
9
ns
ns
ns
CORRECT
Not Internal Control Mode
DIAG MODE
Not Internal Control Mode
CODE ID1,0
—
13
—
—
ns
14
22
12
17
ns
16(6)
20
15
18
ns
LEIN
18
24
16
From latched to Transparent
LEDIAG
u
14(6)
20
13
From latched to Transparent
Internal LEDIAG
u
14(6)
19
14
Control From latched to Transparent
Mode DATA0–31
u
14
22 (2)
11
Via Diagnostic Latch
19
ns
16
ns
16
ns
14
ns
SET-UP AND HOLD TIMES RELATIVE TO LATCH ENABLES
2584 tbl 32
From Input
DATA0–31 (4)
CB0–7(4)
DATA0–31(4, 6)
CB0–7 (CODE ID 00, 11)(4, 6)
CB0–7 (CODE ID 10)(4, 6)
CORRECT(4, 6)
DIAG MODE(4, 6)
CODE ID1,0(4, 6)
LEIN(4, 6)
d
d
d
d
d
ud
d
d
ud
DATA0–31(4, 6)
NOTE: (15) above applies to correction path.
OUTPUT ENABLE/DISABLE TIMES(5)
To Input
(Latching Data)
LEIN
LEIN
LEOUT/GENERATE
LEOUT/GENERATE
LEOUT/GENERATE
LEOUT/GENERATE
LEOUT/GENERATE
LEOUT/GENERATE
LEOUT/GENERATE
LEDIAG
Set-up Time
Min.
3
2
6(15)
12
8
7
14
9
16
3
Hold Time
Min.
3
3
0
0
0
0
0
0
0
3
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
2584 tbl 33
Enable
Disable
From Input
OE Byte0–3
OESC
Enable
d
d
Disable
u
u
MINIMUM PULSE WIDTHS(6)
ud LEIN, LEOUT/GENERATE, LEDIAG
(Positive–going pulse)
To Output
DATA0–31
SC0–7
Min.
0
0
Max.
10
10
Min.
0
0
Min.
5
Max.
12
12
Unit
ns
ns
2584 tbl 34
ns
NOTES:
2584 tbl 35
1. CI = 50pF.
2. These parameters are combinational propagation delay calculations, and are not tested in production.
3. Data In or Correct Data Out measurement requires timing as shown in the Switching Waveforms.
4. Set-up and Hold times relative to Latch Enables (Latching Data).
5. Output tests specified with CI = 5pF and measured to 0.5V change of output level. Testing is performed at CI = 50pF and correlated to CI = 5F.
6. Not production tested, guaranteed by characterization.
11.6
20
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