M29W400 データシートの表示（PDF） - STMicroelectronics

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M29W400

4 Mbit (512Kb x8 or 256Kb x16, Boot Block) Low Voltage Single Supply Flash Memory

STMicroelectronics 

Table 11. AC Measurement Conditions

Input Rise and Fall Times

Input Pulse Voltages

Input and Output Timing Ref. Voltages

≤ 10ns

0 to 3V

1.5V

Figure 4. AC Testing Input Output Waveform

3V

1.5V

0V

AI01417

M29W400T, M29W400B

Figure 5. AC Testing Load Circuit

0.8V

1N914

DEVICE

UNDER

TEST

3.3kΩ

OUT

CL = 30pF or 100pF

CL includes JIG capacitance

AI01968

Table 12. Capacitance (1) (TA = 25 °C, f = 1 MHz )

Symbol

Parameter

Test Condition

CIN

Input Capacitance

VIN = 0V

COUT

Output Capacitance

Note: 1. Sampled only, not 100% tested.

VOUT = 0V

Min

Max

Unit

6

pF

12

pF

Table 13. DC Characteristics

(TA = 0 to 70°C, –20 to 85°C or –40 to 85°C; VCC = 2.7V to 3.6V)

Symbol

Parameter

Test Condition

ILI

Input Leakage Current

ILO

Output Leakage Current

0V ≤ VIN ≤ VCC

0V ≤ VOUT ≤ VCC

ICC1

ICC1

ICC3

ICC4 (1)

Supply Current (Read) Byte

Supply Current (Read) Word

Supply Current (Standby)

Supply Current (Program or Erase)

E = VIL, G = VIH, f = 6MHz

E = VIL, G = VIH, f = 6MHz

E = VCC ± 0.2V

Byte program, Block or

Chip Erase in progress

VIL

Input Low Voltage

VIH Input High Voltage

VOL Output Low Voltage

VOH Output High Voltage CMOS

IOL = 4mA

IOH = –100µA

VID A9 Voltage (Electronic Signature)

IID

A9 Current (Electronic Signature)

VLKO

Supply Voltage (Erase and

Program lock-out)

Note: 1. Sampled only, not 100% tested.

A9 = VID

Min

–0.5

0.7 VCC

VCC –0.4V

11.0

2.0

Max

±1

±1

10

10

50

20

0.8

VCC + 0.3

0.45

12.0

100

2.3

Unit

µA

µA

mA

mA

µA

mA

V

V

V

V

V

µA

V

13/34

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