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M29W400 データシートの表示(PDF) - STMicroelectronics

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M29W400 Datasheet PDF : 34 Pages
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M29W400T, M29W400B
Table 14B. Read AC Characteristics
(TA = 0 to 70°C, –20 to 85°C or –40 to 85°C)
Symbol Alt
Parameter
Test
Condition
M29W400T / M29W400B
-120
-150
VCC = 2.7V to 3.6V VCC = 2.7V to 3.6V
Unit
Min
Max
Min
Max
tAVAV
tRC Address Valid to Next Address Valid
E = VIL,
G = VIL
120
150
ns
tAVQV tACC Address Valid to Output Valid
E = VIL,
G = VIL
120
150
ns
tELQX (1)
tLZ
Chip Enable Low to Output
Transition
G = VIL
0
0
ns
tELQV (2) tCE Chip Enable Low to Output Valid
G = VIL
120
150
ns
tGLQX (1)
tOLZ
Output Enable Low to Output
Transition
E = VIL
0
0
ns
tGLQV (2) tOE Output Enable Low to Output Valid
E = VIL
50
55
ns
tEHQX
tOH
Chip Enable High to Output
Transition
G = VIL
0
0
ns
tEHQZ (1) tHZ Chip Enable High to Output Hi-Z
G = VIL
30
40
ns
tGHQX
tOH
Output Enable High to Output
Transition
E = VIL
0
0
ns
tGHQZ (1) tDF Output Enable High to Output Hi-Z
E = VIL
30
40
ns
tAXQX
tOH
Address Transition to Output
Transition
E = VIL,
G = VIL
0
0
ns
tPLYH (1,3)
tRRB
tREADY
RP Low to Read Mode
10
10
µs
tPHEL tRH RP High to Chip Enable Low
50
50
ns
tPLPX
tRP RP Pulse Width
500
500
ns
tELBL
tELBH
tELFL Chip Enable to BYTE Switching Low
tELFH or High
5
5
ns
tBLQZ
tFLQZ
BYTE Switching Low to Output
High Z
60
60
ns
tBHQV
tFHQV
BYTE Switching High to Output
Valid
60
Notes: 1. Sampled only, not 100% tested.
2. G may be delayed by up to tELQV - tGLQV after the falling edge of E without increasing tELQV.
3. To be considered only if the Reset pulse is given while the memory is in Erase or Program mode.
60
ns
15/34

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