M29W008AB データシートの表示（PDF） - STMicroelectronics

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M29W008AB

8 Mbit (1Mb x8, Boot Block) Low Voltage Single Supply Flash Memory

STMicroelectronics 

M29W008AT, M29W008AB

Table 12. AC Measurement Conditions

Input Rise and Fall Times

≤10ns

Input Pulse Voltages

0 to 3V

Input and Output Timing Ref. Voltages

1.5V

Figure 3. AC Testing Input Output Waveform

3V

1.5V

0V

AI01417

Figure 4. AC Testing Load Circuit

0.8V

1N914

DEVICE

UNDER

TEST

3.3kΩ

OUT

CL = 30pF or 100pF

CL includes JIG capacitance

AI01968

Table 13. Capacitance (1) (TA = 25 °C, f = 1 MHz)

Symbol

Parameter

Test Condition

Min

CIN

Input Capacitance

VIN = 0V

COUT

Output Capacitance

Note: Sampled only, not 100% tested.

VOUT = 0V

Table 14. DC Characteristics

(TA = 0 to 70°C, –20 to 85°C or –40 to 85°C; VCC = 2.7V to 3.6V)

Symbol

Parameter

Test Condition

Min

ILI Input Leakage Current

ILO Output Leakage Current

ICC1 Supply Current (Read)

ICC2 Supply Current (Read)

0V ≤ VIN ≤ VCC

0V ≤ VOUT ≤ VCC

E = VIL, G = VIH, f = 6MHz

E = VIL, G = VIL, f = 6MHz

ICC3 Supply Current (Stand-by)

E = VCC ±0.2V

ICC4 (1)

Supply Current

(Program or Erase)

Byte program, Block or

Chip Erase in progress

VIL Input Low Voltage

VIH Input High Voltage

–0.5

0.7 VCC

VOL Output Low Voltage

IOL = 1.8mA

VOH Output High Voltage CMOS

VID A9 Voltage (Electronic Signature)

IID A9 Current (Electronic Signature)

VLKO (1)

Supply Voltage (Erase and

Program lock-out)

Note: 1. Sampled only, not 100% tested.

IOH = –100µA

A9 = VID

VCC –0.4V

11.5

2.0

Max

Unit

6

pF

12

pF

Typ.

3

4.5

30

30

Max Unit

±1

µA

±1

µA

10

mA

100

mA

100

µA

20

mA

0.8

V

VCC + 0.3 V

0.45

V

V

12.5

V

100

µA

2.3

V

12/30

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